Samples can be configured in multiple ways: Multilayers, Islands, wires, spheres on substrates. NIST’s Simulation of Electron Spectra for Surface Analysis (SESSA) is a great tool for simulating your AES XPS Spectra. The proposal was submitted by Professor Kristi Koski, and co-PIs Charles S Fadley, Coleman Kronawitter, Frank Osterloh and Jesus Velazquez. The Axis Supra is also equipped with a high tilt sample arm which can be used to acquire Angle-Resolved XPS (ARXPS).Īcquisition of the Axis Supra was funded by NSF-MRI 182838. Furthermore, the heat and cool holder allow the user to perform in-situ experiments in the sample analysis chamber. The SSS gives the user the in-situ capability of exposing samples to a variety of gas environments pre and post analysis without having to break vacuum. The Axis Supra is also equipped with a Minibeam 4, Ar+ ion gun designed for surface cleaning and relative depth profiling.Īn ultrahigh vacuum (UHV) Surface Science Station (SSS) is attached to the analysis chamber by a load lock. The Axis Supra is equipped with a Monchromated X-Ray Gun (Al and Ag anodes), an Achromatic X-Ray Gun (Al and Mg anodes), and Ultraviolet Photoelectron Spectroscopy (UPS) He lamp.Ī Hemispherical and Spherical mirror analyzer equipped with a 128 channel Delay-Line Detector allows for fast parallel imaging and excellent signal-to-noise. XPS is a surface sensitive technique, which allows the user to analyze the composition of their sample within the first 10nm of the surface.
The Axis Supra is a X-Ray Photoelectron Spectrometer (XPS) manufactured by Kratos Analytical.